Towards time-resolved THz imaging

被引：18

作者：

Planken, PCM

Bakker, HJ

机构：

[1] FOM, Inst AMOLF, NL-1098 SJ Amsterdam, Netherlands

[2] Delft Univ Technol, Fac Sci Appl, Dept Appl Phys, NL-2628 CJ Delft, Netherlands

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2004年 / 78卷 / 04期

关键词：

D O I：

10.1007/s00339-003-2405-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We describe a setup that allows for the measurement of high-quality images at frequencies in the far-infrared (THz) regime of the spectrum. By using water-cooled THz emitters that are biased with a 50-kHz, +/-400-V square wave, rapid delay scanning, and differential lock-in detection at 50 kHz, we attain shot-noise-limited detection of THz transients. As a result, THz transients with a large dynamic range of similar to5000 can be measured in 20 ms. We show that the THz imaging setup enables the time-resolved detection of the diffusion of gases.

引用

页码：465 / 469

页数：5

共 17 条

[11] CHARACTERIZATION OF AN OPTOELECTRONIC TERAHERTZ BEAM SYSTEM [J].