Amorphous Pb(Zr, Ti)O3 thin film hydrogen gas sensor

被引:26
作者
Deng, J
Zhu, W
Tan, OK
Yao, X
机构
[1] Nanyang Technol Univ, Ctr Microelect, Sch Elect & Elect Engn, Singapore 639798, Singapore
[2] Tongji Univ, Funct Mat Res Ctr, Shanghai 200092, Peoples R China
关键词
lead zirconate titanate; amorphous; hydrogen sensor; I-V characteristics;
D O I
10.1016/S0925-4005(01)00707-9
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The capacitive Pd/lead zirconate titanate (PZT)/Pt devices have been fabricated with amorphous Pb(Zr-x, Ti1-x)O-3 (x = 0, 30, 53, 65, 90) thin films deposited using the sol-gel spin-coating technology. The PZT films have been characterized by TGA, DTA, X-ray diffraction (XRD), dielectric and electrical properties, and gas sensitivity measurement. It has been shown that the amorphous PZT film can be operative as a hydrogen gas sensor material. The gas sensitivity of Pd/PZT/Pt devices has been systematically studied, and it has been observed that the sensitivity of the turn-on voltage shift in de I-V curves is as large as 2.3 V at 1000 ppm hydrogen gas diluted in air. Among the PZT films with different Zr/Ti ratios, it has been investigated that the PZT film with Zr/Ti = 30/70 has the lowest dielectric loss, lowest leakage current, and highest gas sensitivity to hydrogen. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:416 / 420
页数:5
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