Image quality vs radiation dose for a flat-panel amorphous silicon detector: a phantom study

被引:65
作者
Geijer, H [1 ]
Beckman, KW
Andersson, T
Persliden, J
机构
[1] Orebro Med Ctr Hosp, Dept Radiol, S-70185 Orebro, Sweden
[2] Orebro Med Ctr Hosp, Dept Med Phys, S-70185 Orebro, Sweden
关键词
X-ray; radiation dosage; digital radiography; image processing; computer-assisted radiographic image enhancement/instrumentation;
D O I
10.1007/s003300100851
中图分类号
R8 [特种医学]; R445 [影像诊断学];
学科分类号
1002 ; 100207 ; 1009 ;
摘要
The aim of this study was to investigate the image quality for a flat-panel amorphous silicon detector at various radiation dose settings and to compare the results with storage phosphor plates and a screen-film system. A CDRAD 2.0 contrast-detail phantom was imaged with a flat-panel detector (Philips Medical Systems, Eindhoven, The Netherlands) at three different dose levels with settings for intravenous urography. The same phantom was imaged with storage phosphor plates at a simulated system speed of 200 and a screen-film system with a system speed of 160. Entrance surface doses were recorded for all images. At each setting, three images were read by four independent observers. The flat-panel detector had equal image quality at less than half the radiation dose compared with storage phosphor plates. The difference was even larger when compared with film with the flat-panel detector having equal image quality at approximately one-fifth the dose. The flat-panel detector has a very favourable combination of image quality vs radiation dose compared with storage phosphor plates and screen film.
引用
收藏
页码:1704 / 1709
页数:6
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