Three-terminal scanning tunneling spectroscopy of suspended carbon nanotubes

被引：48

作者：

LeRoy, BJ ^{[1
]}

Kong, J ^{[1
]}

Pahilwani, VK ^{[1
]}

Dekker, C ^{[1
]}

Lemay, SG ^{[1
]}

机构：

[1] Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands

来源：

PHYSICAL REVIEW B | 2005年 / 72卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.72.075413

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have performed low-temperature scanning tunneling spectroscopy measurements on suspended single-wall carbon nanotubes with a gate electrode allowing three-terminal spectroscopy measurements. These measurements show well-defined Coulomb diamonds as well as side peaks from phonon-assisted tunneling. The side peaks have the same gate voltage dependence as the main Coulomb peaks, directly proving that they are excitations of these states.

引用

收藏

页数：5

相关论文

共 21 条

[1]

AJI V, 2004, INT J NANOSCI, V3, P255

[2] Bistable tunneling current through a molecular quantum dot [J].

Alexandrov, AS ;

Bratkovsky, AM ;

Williams, RS .

PHYSICAL REVIEW B, 2003, 67 (07)

[3] Influence of nanomechanical properties on single-electron tunneling: A vibrating single-electron transistor [J].

Boese, D ;

Schoeller, H .

EUROPHYSICS LETTERS, 2001, 54 (05) :668-674

[4] Phonons in carbon nanotubes [J].

Dresselhaus, MS ;

Eklund, PC .

ADVANCES IN PHYSICS, 2000, 49 (06) :705-814

[5] Vibrational instability due to coherent tunneling of electrons [J].

Fedorets, D ;

Gorelik, LY ;

Shekhter, RI ;

Jonson, M .

EUROPHYSICS LETTERS, 2002, 58 (01) :99-104

[6] Tunneling broadening of vibrational sidebands in molecular transistors [J].

Flensberg, K .

PHYSICAL REVIEW B, 2003, 68 (20)

[7]

Grabert H., 1992, Single Charge Tunneling

[8] VARIATION OF THE COULOMB STAIRCASE IN A 2-JUNCTION SYSTEM BY FRACTIONAL ELECTRON CHARGE [J].

HANNA, AE ;

TINKHAM, M .

PHYSICAL REVIEW B, 1991, 44 (11) :5919-5922

[9] THE SINGLE-ELECTRON TRANSISTOR [J].

KASTNER, MA .

REVIEWS OF MODERN PHYSICS, 1992, 64 (03) :849-858

[10] Integration of a gate electrode into carbon nanotube devices for scanning tunneling microscopy [J].

Kong, J ;

LeRoy, BJ ;

Lemay, SG ;

Dekker, C .

APPLIED PHYSICS LETTERS, 2005, 86 (11) :1-3