Optical and structural characterization of erbium-doped TiO2 xerogel films processed on porous anodic alumina

被引：36

作者：

Gaponenko, NV ^{[1
]}

Sergeev, OV

Stepanova, EA

Parkun, VM

Mudryi, AV

Gnaser, H

Misiewicz, J

Heiderhoff, R

Balk, LJ

Thompson, GE

机构：

[1] Belarusian State Univ Informat & Radioelect, Minsk 220027, BELARUS

[2] Inst Gen & Inorgan Chem, Minsk 220027, BELARUS

[3] Univ Kaiserslautern, Inst Oberflachen & Schichtanalyt, D-67663 Kaiserslautern, Germany

[4] Wroclaw Univ Technol, Inst Phys, PL-50370 Wroclaw, Poland

[5] Berg Univ Wuppertal, Fachbereich Elektrotech, Fachgebiet Elekt, D-42097 Wuppertal, Germany

[6] Univ Manchester, Inst Sci & Technol, Ctr Corros & Protect, Manchester M60 1QD, Lancs, England

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 2001年 / 148卷 / 02期

关键词：

D O I：

10.1149/1.1339864

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

Titania films, doped with erbium, were fabricated on porous anodic alumina from a Ti(OC2H5)(4) precursor. The samples, subjected to thermal processing up to 1270 K, exhibited strong luminescence at 1.53 mum associated with I-4(13/2)->I-4(15/2) transitions of Er3+ ions in the TiO2 xerogel. The intensity of photoluminescence increased with the number of xerogel film depositions onto alumina. Secondary ion mass spectrometry analyses show that the pores of anodic alumina are filled by the xerogel after sequential spinning of ten layers. Cooling of the samples to 4.2 K gives enhancement of the intensity of the Er-related band at 1.53 mum and narrowing of the full width at half maximum from 20 to 10 nm. (C) 2001 The Electrochemical Society. All rights reserved.

引用

页码：H13 / H16

页数：4

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