Probing local electronic transport at the organic single-crystal/dielectric interface

被引：35

作者：

Luo, Yi

Gustavo, Frederic

Henry, Jean-Yves

Mathevet, Fabrice

Lefloch, Francois

Sanquer, Marc

Rannou, Patrice

Grevin, Benjamin

机构：

[1] CEA Grenoble, DRFMC, Struct Proprietes Architect Mol, UMR5819 SPrAM, F-38054 Grenoble 9, France

[2] CEA Grenoble, DRFMC, Serv Phys Stat Magnet & Supraconduct SPSMS, F-38054 Grenoble 9, France

[3] MINATEC, CEA LETI, F-38054 Grenoble, France

来源：

ADVANCED MATERIALS | 2007年 / 19卷 / 17期

关键词：

D O I：

10.1002/adma.200700913

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

We demonstrate that scanning Kelvin probe microscopy (SKPM), an atomic force microscopy (AFM)-based potentiometric technique, allows for an in-depth exploration of the local electrical potential at the organic/dielectric interface in sub-pm thick organic single crystals (OSCs), opening novel perspectives for a deeper understanding of intrinsic charge transport, interfacial and contact effects in semiconducting organic single crystals.

引用

收藏

页码：2267 / +

页数：8

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