Progresses in III-nitride distributed Bragg reflectors and microcavities using AlInN/GaN materials

被引:145
作者
Carlin, JF [1 ]
Zellweger, C [1 ]
Dorsaz, J [1 ]
Nicolay, S [1 ]
Christmann, G [1 ]
Feltin, E [1 ]
Butté, R [1 ]
Grandjean, N [1 ]
机构
[1] Ecole Polytech Fed Lausanne, Inst Quantum Elect & Photon, CH-1015 Lausanne, Switzerland
来源
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2005年 / 242卷 / 11期
关键词
D O I
10.1002/pssb.200560968
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We propose to use lattice-matched AlInN/GaN to replace the Al(Ga)N/GaN material system for III-nitride Bragg reflectors, despite the poor material quality of AlInN reported until very recently. We report an improvement of AlInN material that allowed for successful fabrication of a microcavity light emitting diode, a distributed Bragg reflector with 99.4% reflectivity and microcavities with a quality factor over 800. These results establish state-of-the-art values for III-nitrides, and announce the future importance of AlInN in GaN-based optoelectronics. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
引用
收藏
页码:2326 / 2344
页数:19
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