Visualization of defect densities in reduced graphene oxide

被引:495
作者
Eigler, Siegfried [1 ]
Dotzer, Christoph
Hirsch, Andreas
机构
[1] Univ Erlangen Nurnberg, Dept Chem & Pharm, D-91054 Erlangen, Germany
基金
欧洲研究理事会;
关键词
GRAPHITE; REDUCTION;
D O I
10.1016/j.carbon.2012.03.039
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Efficiently reducible graphene oxide (GO) was obtained, even if a high degree of functionalization is present. Graphite with few defects was used as starting material and oxidized according to Hummer's method. An extremely high I-D/I-G ratio for rGO of 2.8 (532 nm) was observed in the Raman spectrum as a consequence of the lower defect density in GO. It was also possible to demonstrate the impact of local defects on the structure in rGO by local laser exposure experiments on single graphene oxide flakes. Raman spectroscopy can visualize the laser impact by I-D/I-G ratio measurements. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:3666 / 3673
页数:8
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