The microstructure of Pb(Zr,Ti)O-3 and Pb(Zr, Ti)O-3/YBa2Cu3O7 films

被引：12

作者：

Cao, LX ^{[1
]}

Xu, Y ^{[1
]}

Zhao, BR ^{[1
]}

Guo, LP ^{[1
]}

Liu, JZ ^{[1
]}

Xu, B ^{[1
]}

Wu, F ^{[1
]}

Li, L ^{[1
]}

Zhao, ZX ^{[1
]}

Zhu, AJ ^{[1
]}

Mai, ZH ^{[1
]}

Zhao, JH ^{[1
]}

Fu, YF ^{[1
]}

Li, XJ ^{[1
]}

机构：

[1] HUAZHONG UNIV SCI & TECHNOL,DEPT SOLID STATE ELECTR,WUHAN 430074,PEOPLES R CHINA

来源：

SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1996年 / 9卷 / 04期

关键词：

D O I：

10.1088/0953-2048/9/4/008

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Pb(Zr0.53Ti0.47)O-3 (PZT 53/47) is a polycrystalline film with coarse square-shaped grains. The surface morphology can be improved by reducing the cooling rate at the Curie temperature region; however this morphology still does not meet the requirement of device engineering. Pb(Zr0.2Ti0.8)O-3 (PZT 20/80) film has been synthesized, to reduce the lattice mismatch between PZT and substrate. This film has a smooth surface without any evident crystalline features. A TEM of the cross-sectional PZT/YBa2Cu3O7 (YBCO) integrated film shows there is no interaction between the PZT, YBCO and substrate. ZrO2 particles are detected in the PZT film.

引用

页码：310 / 314

页数：5

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