Enhancing higher harmonics of a tapping cantilever by excitation at a submultiple of its resonance frequency

被引:26
作者
Balantekin, M [1 ]
Atalar, A [1 ]
机构
[1] Bilkent Univ, Dept Elect Engn, TR-06800 Ankara, Turkey
关键词
D O I
10.1103/PhysRevB.71.125416
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In a tapping-mode atomic force microscope, the frequency spectrum of the oscillating cantilever contains higher harmonics at integer multiples of the excitation frequency. When the cantilever oscillates at its fundamental resonance frequency w(1), the high Q-factor damps the amplitudes of the higher harmonics to negligible levels, unless the higher flexural eigenmodes are coincident with those harmonics. One can enhance the nth harmonic by the Q factor when the cantilever is excited at a submultiple of its resonance frequency (w(1)/n). Hence, the magnitude of the nth harmonic can be measured easily and it can be utilized to examine the material properties. We show theoretically that the amplitude of enhanced higher harmonic increases monotonically for a range of sample stiffness, if the interaction is dominated by elastic force.
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页数:6
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共 42 条
[1]   Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy [J].
Amelio, S ;
Goldade, AV ;
Rabe, U ;
Scherer, V ;
Bhushan, B ;
Arnold, W .
THIN SOLID FILMS, 2001, 392 (01) :75-84
[2]   How to measure energy dissipation in dynamic mode atomic force microscopy [J].
Anczykowski, B ;
Gotsmann, B ;
Fuchs, H ;
Cleveland, JP ;
Elings, VB .
APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :376-382
[3]   Power dissipation analysis in tapping-mode atomic force microscopy [J].
Balantekin, M ;
Atalar, A .
PHYSICAL REVIEW B, 2003, 67 (19)
[4]   Simulations of switching vibrating cantilever in atomic force microscopy [J].
Balantekin, M ;
Atalar, A .
APPLIED SURFACE SCIENCE, 2003, 205 (1-4) :86-96
[5]   A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics [J].
Bielefeldt, H ;
Giessibl, FJ .
SURFACE SCIENCE, 1999, 440 (03) :L863-L867
[6]   Scanning local-acceleration microscopy [J].
Burnham, NA ;
Kulik, AJ ;
Gremaud, G ;
Gallo, PJ ;
Oulevey, F .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :794-799
[7]   MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE [J].
BURNHAM, NA ;
COLTON, RJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2906-2913
[8]   Energy dissipation in tapping-mode atomic force microscopy [J].
Cleveland, JP ;
Anczykowski, B ;
Schmid, AE ;
Elings, VB .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2613-2615
[9]   Measurement of elastic modulus of nanotubes by resonant contact atomic force microscopy [J].
Cuenot, S ;
Frétigny, C ;
Demoustier-Champagne, S ;
Nysten, B .
JOURNAL OF APPLIED PHYSICS, 2003, 93 (09) :5650-5655
[10]   Localized surface elasticity measurements using an atomic force microscope [J].
DeVecchio, D ;
Bhushan, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (12) :4498-4505