Epitaxial Lift-Off for large area thin film III/V devices

被引:110
作者
Schermer, JJ [1 ]
Mulder, P [1 ]
Bauhuis, GJ [1 ]
Voncken, MMAJ [1 ]
van Deelen, J [1 ]
Haverkamp, E [1 ]
Larsen, PK [1 ]
机构
[1] Radboud Univ Nijmegen, Inst Mol & Mat, NL-6525 ED Nijmegen, Netherlands
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2005年 / 202卷 / 04期
关键词
D O I
10.1002/pssa.200460410
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The present work describes the study and improvement of the Epitaxial Lift-Off (ELO) technique, which is used to separate III/V device structures from their GaAs substrates. As a result the ELO method, initially able to separate millimetre sized GaAs layers with a lateral etch rate of about 0.3 mm/h, has been developed to a process capable to free entire 2 '' epitaxial structures from their substrates with etch rates up to 30 mm/h. It is shown that with the right deposition and ELO strategy, the thin-film III/V structures can be adequately processed on both sides. In this way semi-transparent, bifacial solar cells on glass were produced with a total area efficiency in excess of 20% upon front side illumination and more than 15% upon back side illumination. The cell characteristics indicate that, once the thin film processing has been optimized, ELO cells require a significantly thinner base layer than regular III/V cells on a GaAs substrate and at the same time have the potential to reach a higher efficiency. (c) 2005 WILEY-VCH Verlag GmbH T Co.
引用
收藏
页码:501 / 508
页数:8
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