Influence of tip modulation on image formation in scanning near-field optical microscopy

Modulation of the probe height in a scanning near-field optical microscope (SNOM) is a technique that is commonly used for both distance control and separation of the near-field signal from a background. Detection of higher harmonic modulated signals has also been used to obtain an improvement in resolution, the elimination of background, or artifacts in the signal. This article presents a theoretical model for the effects induced in SNOM images by modulation of the probe. It is shown that probe modulation introduces a spatial filter into the image, generally suppressing propagating field components and enhancing the strength of evanescent field components. A simple example of detection of a single evanescent field above a prism is studied in some detail, and a complicated dependence on modulation parameters and waveform is shown. Some aspects of the application of this theory in a general experimental situation are discussed. Simulated images are displayed to explicitly show the effects of varying modulation amplitude with first and second harmonic detection. Finally, we discuss the suppression of background artifacts due to propagating fields through the use of higher harmonic detection. (C) 2001 American Institute of Physics.