SiGe heterostructures for FET applications

被引:67
作者
Whall, TE [1 ]
Parker, EHC [1 ]
机构
[1] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
关键词
D O I
10.1088/0022-3727/31/12/003
中图分类号
O59 [应用物理学];
学科分类号
摘要
The high room-temperature carrier mobilities which have recently been observed for both electrons and holes in Si/SiGe heterostructures and the possibility of further improvements offer the prospect of silicon-based field effect transistors (FETs) with performances matching those of bipolar transistors and ill-V modulation-doped FETs. In this article the electrical properties of this semiconductor system and the associated materials challenges are discussed, and some of the more important device applications are reviewed.
引用
收藏
页码:1397 / 1416
页数:20
相关论文
共 92 条
[21]   2-DIMENSIONAL HOLE GAS IN SI/SIGE HETEROSTRUCTURES [J].
FANG, FF ;
WANG, PJ ;
MEYERSON, BS ;
NOCERA, JJ ;
ISMAIL, KE .
SURFACE SCIENCE, 1992, 263 (1-3) :175-178
[22]   2DEG IN STRAINED SI/SIGE HETEROSTRUCTURES [J].
FANG, FF .
SURFACE SCIENCE, 1994, 305 (1-3) :301-306
[23]   ROUGHNESS ANALYSIS OF SI/SIGE HETEROSTRUCTURES [J].
FEENSTRA, RM ;
LUTZ, MA ;
STERN, F ;
ISMAIL, K ;
MOONEY, PM ;
LEGOUES, FK ;
STANIS, C ;
CHU, JO ;
MEYERSON, BS .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (04) :1608-1612
[24]   SCATTERING FROM STRAIN VARIATIONS IN HIGH-MOBILITY SI/SIGE HETEROSTRUCTURES [J].
FEENSTRA, RM ;
LUTZ, MA .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (10) :6091-6097
[25]  
FERRY D, 1981, VLSI ELECTRONICS MIC, V2, P68
[26]   ELIMINATION OF INTERFACE DEFECTS IN MISMATCHED EPILAYERS BY A REDUCTION IN GROWTH AREA [J].
FITZGERALD, EA ;
KIRCHNER, PD ;
PROANO, R ;
PETTIT, GD ;
WOODALL, JM ;
AST, DG .
APPLIED PHYSICS LETTERS, 1988, 52 (18) :1496-1498
[27]   TEMPERATURE-DEPENDENCE OF THE CONDUCTIVITY FOR THE TWO-DIMENSIONAL ELECTRON-GAS - ANALYTICAL RESULTS FOR LOW-TEMPERATURES [J].
GOLD, A ;
DOLGOPOLOV, VT .
PHYSICAL REVIEW B, 1986, 33 (02) :1076-1084
[28]   FABRICATION OF A SI1-XGEX CHANNEL METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR (MOSFET) CONTAINING HIGH GE FRACTION LAYER BY LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION [J].
GOTO, K ;
MUROTA, J ;
MAEDA, T ;
SCHUTZ, R ;
AIZAWA, K ;
KIRCHER, R ;
YOKOO, K ;
ONO, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1993, 32 (1B) :438-441
[29]   The elimination of surface cross-hatch from relaxed, limited-area Si1-xGex buffer layers [J].
Hammond, R ;
Phillips, PJ ;
Whall, TE ;
Parker, EHC ;
Graf, T ;
VonKanel, H ;
Shields, AJ .
APPLIED PHYSICS LETTERS, 1997, 71 (17) :2517-2519
[30]   CHARGED CARRIER TRANSPORT IN SI1-XGEX PSEUDOMORPHIC ALLOYS MATCHED TO SI STRAIN-RELATED TRANSPORT IMPROVEMENTS [J].
HINCKLEY, JM ;
SANKARAN, V ;
SINGH, J .
APPLIED PHYSICS LETTERS, 1989, 55 (19) :2008-2010