A new a-Si:H TFT pixel circuit compensating the threshold voltage shift of a-Si:H TFT and OLED for active matrix OLED

被引:97
作者
Lee, JH [1 ]
Kim, JH [1 ]
Han, MK [1 ]
机构
[1] Seoul Natl Univ, Sch Elect Engn, Seoul 151742, South Korea
关键词
active matrix organic light-emitting diode (AMOLED); amorphous silicon thin-film transistor (a-Si : H TFT); pixel; degradation;
D O I
10.1109/LED.2005.859674
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose a new hydrogenated amorphous silicon thin-film transistor (a-Si:H TFT) pixel circuit for an active matrix organic light-emitting diode (AMOLED) employing a voltage programming. The proposed a-Si:H TFT pixel circuit, which consists of five switching TFTs, one driving TFT, and one capacitor, successfully minimizes a decrease of OLED current caused by threshold voltage degradation of a-Si:H TFT and OLED. Our experimental results, based on the bias-temperature stress, exhibit that the output current for OLED is decreased by 7% in the proposed pixel, while it is decreased by 28% in the conventional 2-TFT pixel.
引用
收藏
页码:897 / 899
页数:3
相关论文
共 8 条
[1]   Operating lifetime of phosphorescent organic light emitting devices [J].
Burrows, PE ;
Forrest, SR ;
Zhou, TX ;
Michalski, L .
APPLIED PHYSICS LETTERS, 2000, 76 (18) :2493-2495
[2]   The impact of the transient response of organic light emitting diodes on the design of active matrix OLED displays [J].
Dawson, RMA ;
Shen, Z ;
Furst, DA ;
Connor, S ;
Hsu, J ;
Kane, MG ;
Stewart, RG ;
Ipri, A ;
King, CN ;
Green, PJ ;
Flegal, RT ;
Pearson, S ;
Barrow, WA ;
Dickey, E ;
Ping, K ;
Robinson, S ;
Tang, CW ;
Van Slyke, S ;
Chen, F ;
Shi, J ;
Lu, MH ;
Sturm, JC .
INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST, 1998, :875-878
[3]   A new a-Si:H thin-film transistor pixel circuit for active-matrix organic light-emitting diodes [J].
Goh, JC ;
Jang, J ;
Cho, KS ;
Kim, CK .
IEEE ELECTRON DEVICE LETTERS, 2003, 24 (09) :583-585
[4]   Four-thin film transistor pixel electrode circuits for active-matrix organic light-emitting displays [J].
He, Y ;
Hattori, R ;
Kanicki, J .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (3A) :1199-1208
[5]   Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs [J].
Karim, KS ;
Nathan, A ;
Hack, M ;
Milne, WI .
IEEE ELECTRON DEVICE LETTERS, 2004, 25 (04) :188-190
[6]   A new current scaling pixel circuit for AMOLED [J].
Lee, JH ;
Nam, WJ ;
Jung, SH ;
Han, MK .
IEEE ELECTRON DEVICE LETTERS, 2004, 25 (05) :280-282
[7]   Amorphous silicon thin film transistor circuit integration for organic LED displays on glass and plastic [J].
Nathan, A ;
Kumar, A ;
Sakariya, K ;
Servati, P ;
Sambandan, S ;
Striakhilev, D .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2004, 39 (09) :1477-1486
[8]   TIME AND TEMPERATURE-DEPENDENCE OF INSTABILITY MECHANISMS IN AMORPHOUS-SILICON THIN-FILM TRANSISTORS [J].
POWELL, MJ ;
VANBERKEL, C ;
HUGHES, JR .
APPLIED PHYSICS LETTERS, 1989, 54 (14) :1323-1325