Piezoelectric self-sensing of adsorption-induced microcantilever bending

被引:22
作者
Adams, JD
Rogers, B [1 ]
Manning, L
Hu, Z
Thundat, T
Cavazos, H
Minne, SC
机构
[1] Univ Nevada, Dept Engn Mech, Reno, NV 89557 USA
[2] Univ Nevada, Nevada Ventures Nanosci Program, Reno, NV 89557 USA
[3] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
[4] Nanodevices Inc, Santa Barbara, CA 93111 USA
关键词
piezoelectric; cantilever; adsorption; bending; sensor;
D O I
10.1016/j.sna.2005.03.058
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A self-sensing, self-actuating, piezoelectric microcantilever is used to detect adsorption-induced bending. Bending is measured by bringing the resonating cantilever into intermittent contact with a surface, the elevation of which is maintained by a piezotube in feedback. When the cantilever bends, its oscillatory amplitude changes and the piezotube is adjusted to compensate. Cantilever amplitude is detected using the voltage output of the piezoelectric film. Bending in this test was caused by mercury adsorption onto gold. A 50 ppb mercury concentration in nitrogen gas was detected. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:457 / 461
页数:5
相关论文
共 34 条
[1]   Micromachined piezoresistive cantilever array with integrated resistive microheater for calorimetry and mass detection [J].
Abedinov, N ;
Grabiec, P ;
Gotszalk, T ;
Ivanov, T ;
Voigt, J ;
Rangelow, IW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2001, 19 (06) :2884-2888
[2]   Integrated atomic force microscopy array probe with metal-oxide-semiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metal-oxide-semiconductor electronics [J].
Akiyama, T ;
Staufer, U ;
de Rooij, NF ;
Lange, D ;
Hagleitner, C ;
Brand, O ;
Baltes, H ;
Tonin, A ;
Hidber, HR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (06) :2669-2675
[3]   AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].
ALEXANDER, S ;
HELLEMANS, L ;
MARTI, O ;
SCHNEIR, J ;
ELINGS, V ;
HANSMA, PK ;
LONGMIRE, M ;
GURLEY, J .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167
[4]   SIMULTANEOUS PIEZOELECTRIC SENSING ACTUATION - ANALYSIS AND APPLICATION TO CONTROLLED STRUCTURES [J].
ANDERSON, EH ;
HAGOOD, NW .
JOURNAL OF SOUND AND VIBRATION, 1994, 174 (05) :617-639
[5]   A chemical sensor based on a microfabricated cantilever array with simultaneous resonance-frequency and bending readout [J].
Battiston, FM ;
Ramseyer, JP ;
Lang, HP ;
Baller, MK ;
Gerber, C ;
Gimzewski, JK ;
Meyer, E ;
Güntherodt, HJ .
SENSORS AND ACTUATORS B-CHEMICAL, 2001, 77 (1-2) :122-131
[6]   Environmental sensors based on micromachined cantilevers with integrated read-out [J].
Boisen, A ;
Thaysen, J ;
Jensenius, H ;
Hansen, O .
ULTRAMICROSCOPY, 2000, 82 (1-4) :11-16
[7]   RESONANCE RESPONSE OF SCANNING FORCE MICROSCOPY CANTILEVERS [J].
CHEN, GY ;
WARMACK, RJ ;
THUNDAT, T ;
ALLISON, DP ;
HUANG, A .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (08) :2532-2537
[8]   ADSORPTION-INDUCED SURFACE STRESS AND ITS EFFECTS ON RESONANCE FREQUENCY OF MICROCANTILEVERS [J].
CHEN, GY ;
THUNDAT, T ;
WACHTER, EA ;
WARMACK, RJ .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (08) :3618-3622
[9]   Translating biomolecular recognition into nanomechanics [J].
Fritz, J ;
Baller, MK ;
Lang, HP ;
Rothuizen, H ;
Vettiger, P ;
Meyer, E ;
Güntherodt, HJ ;
Gerber, C ;
Gimzewski, JK .
SCIENCE, 2000, 288 (5464) :316-318
[10]   APPLICATION OF LEAD-ZIRCONATE-TITANATE THIN-FILM DISPLACEMENT SENSORS FOR THE ATOMIC-FORCE MICROSCOPE [J].
FUJII, T ;
WATANABE, S ;
SUZUKI, M ;
FUJIU, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (03) :1119-1122