Stable operation mode for dynamic noncontact atomic force microscopy

被引：83

作者：

Ueyama, H ^{[1
]}

Sugawara, Y ^{[1
]}

Morita, S ^{[1
]}

机构：

[1] Osaka Univ, Fac Engn, Dept Elect Engn, Suita, Osaka 565, Japan

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期

关键词：

D O I：

10.1007/s003390051149

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We investigated the force interaction between tip and surface in the constant-vibration mode and the constant-excitation mode. We found that the distance dependence of the frequency shift reverses in the constant-vibration mode, but it does not in the constant-excitation mode. The repulsive force interaction in the cyclic-contact region weakens in the constant-excitation mode because of the decrease of the vibration amplitude of the cantilever, whereas the repulsive force interaction does not weaken in the constant-vibration mode. Besides, it is quite effective in avoiding the degradation of the initial sharp tip and the destruction of the sample surface when the sudden contact between the tip and the sample surface occurs. We conclude that the constant-excitation mode is stable and gentle compared with the constant-vibration mode.

引用

页码：S295 / S297

页数：3

共 10 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].

ALBRECHT, TR ;

GRUTTER, P ;

HORNE, D ;

RUGAR, D .

JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673

[2]

GIESSIBL FJ, 1995, SCIENCE, V267, P1451

[3] Simultaneous imaging of Si(111) 7x7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode [J].

Guthner, P .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (04) :2428-2431

[4] OBSERVATION OF 7X7 RECONSTRUCTED STRUCTURE ON THE SILICON (111) SURFACE USING ULTRAHIGH-VACUUM NONCONTACT ATOMIC-FORCE MICROSCOPY [J].

KITAMURA, S ;

IWATSUKI, M .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1995, 34 (1B) :L145-L148

[5] Atomic resolution in dynamic force microscopy across steps on Si(111)7 x 7 [J].

Luthi, R ;

Meyer, E ;

Bammerlin, M ;

Baratoff, A ;

Lehmann, T ;

Howald, L ;

Gerber, C ;

Guntherodt, HJ .

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1996, 100 (02) :165-167

[6] Site discrimination of adatoms in Si(111)-7x7 by noncontact atomic force microscopy [J].

Nakagiri, N ;

Suzuki, M ;

Okiguchi, K ;

Sugimura, H .

SURFACE SCIENCE, 1997, 373 (01) :L329-L332

[7]

OHTA M, 1994, J VAC SCI TECHNOL B, V12, P1075

[8] True atomic resolution imaging with noncontact atomic force microscopy [J].

Sugawara, Y ;

Ueyama, H ;

Uchihashi, T ;

Ohta, M ;

Morita, S ;

Suzuki, M ;

Mishima, S .

APPLIED SURFACE SCIENCE, 1997, 113 :364-370

[9] DEFECT MOTION ON AN INP(110) SURFACE OBSERVED WITH NONCONTACT ATOMIC-FORCE MICROSCOPY [J].

SUGAWARA, Y ;

OHTA, M ;

UEYAMA, H ;

MORITA, S .

SCIENCE, 1995, 270 (5242) :1646-1648

[10]

UEYAMA H, 1995, JPN J APPL PHYS, V34, pL1088

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