Study of photocurrent properties of GaN ultraviolet photoconductor grown on 6H-SiC substrate

被引:17
作者
Shen, B [1 ]
Yang, K
Zang, L
Chen, ZZ
Zhou, YG
Chen, P
Zhang, R
Huang, ZC
Zhou, HS
Zheng, YD
机构
[1] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China
[2] Nanjing Univ, Solid State Microstruct Lab, Nanjing 210093, Peoples R China
[3] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
[4] Electrotech Lab, Div Energy Technol, Tsukuba, Ibaraki, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 2A期
关键词
GaN; ultraviolet detector; photocurrent; responsivity; response time;
D O I
10.1143/JJAP.38.767
中图分类号
O59 [应用物理学];
学科分类号
摘要
The properties of a photoconductive ultraviolet detector based on a GaN epilayer grown on a 6H-SiC substrate using metal-organic chemical Vapor deposition were investigated. We obtained the detectable energy span of the device up to the ultraviolet region by photocurrent measurement. The spectral responsivity remained nearly constant for wavelengths ranging from 250 to 365 nm and dropped by three orders of magnitude within 15 nm of the band edge from 365 nm to 380 nm. The detector was measured to have a responsivity of 133 A/W at a wavelength of 360 nm under a 5 V bias, and the voltage-dependent responsivity was evatuated. Furthermore, a convenient method to determine the response time was developed. The relationship between response time and bias was obtained.
引用
收藏
页码:767 / 769
页数:3
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