A simple model of a single-electron floating dot memory for circuit simulation

被引:4
作者
Amakawa, S
Kanda, K
Fujishima, M
Hoh, K
机构
[1] Univ Tokyo, Dept Informat & Commun Engn, Bunkyo Ku, Tokyo 1138656, Japan
[2] Univ Tokyo, VLSI Design & Educ Ctr, Bunkyo Ku, Tokyo 1138656, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1999年 / 38卷 / 1B期
关键词
single-electron transistor; floating dot memory; FN tunneling; circuit simulation;
D O I
10.1143/JJAP.38.429
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new simulation technique for a single-electron floating dot memory based on a semiclassical single-electron transistor is proposed. It is designed to be suitable for use in circuit simulation and it uses a Monte Carlo method in combination with the master equation. Current-voltage characteristics of the sensing single-electron transistor are modeled on the steady-state master equation. Stochastic charging and discharging of the memory dot is simulated by the Monte Carlo method. Our model is faster than the master equation method alone. In addition, drain current of the transistor can be calculated accurately at every instant in the transient simulation, which is time-consuming with the conventional Monte Carlo method alone.
引用
收藏
页码:429 / 432
页数:4
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