Photoluminescence study of InGaAs/AlAsSb heterostructure

被引:64
作者
Georgiev, N [1 ]
Mozume, T [1 ]
机构
[1] Femtosecond Technol Res Assoc, Tsukuba, Ibaraki 30026, Japan
关键词
D O I
10.1063/1.1332797
中图分类号
O59 [应用物理学];
学科分类号
摘要
InGaAs/AlAsSb quantum well structures have been grown by molecular beam epitaxy nominally lattice matched to InP substrates and characterized by photoluminescence. Growth interruptions at interfaces combined with selective group V species exposure were used. Our results indicate that interface quality: interface roughness as well as compositional variations involving group V sublattice species intermixing determine the nature of band alignment at heterointerfaces. The type I band lineup with band-edge discontinuity was estimated to be about 1.6 eV for As-terminated samples, which exhibit the lowest compositional fluctuations across heterointerfaces. The photoluminescence linewidths from InGaAs/AlAsSb quantum wells agree with linewidths calculated on the assumption of 1 ML fluctuations in well width. The inhomogeneous nature of the intermixed layers results in a large broadening of the luminescence spectra line shape for samples grown without termination or Sb termination. (C) 2001 American Institute of Physics.
引用
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页码:1064 / 1069
页数:6
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