Probing the interface potential in stick/slip friction by a lateral force modulation technique

被引：11

作者：

Kerssemakers, J ^{[1
]}

De Hosson, JTM ^{[1
]}

机构：

[1] Univ Groningen, Ctr Mat Sci, Dept Appl Phys, NL-9747 AG Groningen, Netherlands

来源：

SURFACE SCIENCE | 1998年 / 417卷 / 2-3期

关键词：

adhesion; atomic force microscopy; friction; sticking; surface electronic phenomena; tribolog;

D O I：

10.1016/S0039-6028(98)00672-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The influence of the shape of the interaction potential is investigated on details in stick/slip friction as encountered between an AFM tip and a substrate. Based on qualitative arguments of stick/slip systems, a novel technique is introduced in which the AFM tip is brought into a lateral resonance mode. In comparison to a direct measurement in the stick/slip signal, we suggest that the method is preferable to highlight these non-linear characteristics. In combination with the shape of the surface potential involved in stick/slip friction, this modulation diminishes the friction loop amplitude in a controlled way. Furthermore, a partial stick/slip behavior is observed above a certain threshold level of driving amplitude, where the tip alternates periodically between a zero-friction and a non-zero-friction state. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：281 / 291

页数：11

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