Local behavior of complex materials: scanning probes and nano structure

被引：19

作者：

Bonnell, DA ^{[1
]}

Shao, R ^{[1
]}

机构：

[1] Univ Penn, Dept Mat Sci & Engn, Philadelphia, PA 19104 USA

来源：

CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE | 2003年 / 7卷 / 02期

基金：

美国国家科学基金会;

关键词：

scanning probe microscopy; multiple modulation; relaxation; spatial resolution; complex materials;

D O I：

10.1016/S1359-0286(03)00047-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Understanding the behavior of complex materials such as organic self-assembled monolayers, molecular and nano wires, and transition metal oxide thin films, is facilitated by probes of local properties. Recent extensions of scanning probe microscopies that extract electrical potential. capacitance. dielectric constant, electromechanical coupling coefficients and impedance, are described. In most cases, these complex properties are accessed by stimulations and/or response function detection with multiple frequency modulations. Several illustrative examples include determination of the electronic structure of individual defects in a carbon nanotube, ferroelectric domain interactions in oxide thin films, and electric potential of an alkanethiol on metal. (C) 2003 Elsevier Ltd. All rights reserved.

引用

页码：161 / 171

页数：11

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