Characterization of thermally reduced graphene oxide by imaging ellipsometry

被引：197

作者：

Jung, Inhwa ^{[1
]}

Vaupel, Matthias ^{[2
]}

Pelton, Matthew ^{[3
]}

Piner, Richard ^{[1
]}

Dikin, Drnitriy A. ^{[4
]}

Stankovich, Sasha ^{[4
]}

An, Jinho ^{[1
]}

Ruoff, Rodney S. ^{[1
]}

机构：

[1] Univ Texas Austin, Dept Mech Engn, Austin, TX 78712 USA

[2] Nanofilm Technol GmbH, D-37081 Gottingen, Germany

[3] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

[4] Northwestern Univ, Dept Mech Engn, Evanston, IL 60208 USA

来源：

JOURNAL OF PHYSICAL CHEMISTRY C | 2008年 / 112卷 / 23期

关键词：

D O I：

10.1021/jp802173m

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350-1000 nm and were compared to previously reported results measured by confocal microscopy. The dispersion functions for thin platelets were also compared to those obtained by standard spectroscopic ellipsometry on a deposit consisting of many overlapping graphene oxide layers. Changes were observed in both the thickness of the deposits and the values of the dispersion parameters following heating. A model is proposed to explain these observations, based on the removal of water between the graphene-oxide layers upon thermal treatment.

引用

页码：8499 / 8506

页数：8

共 29 条

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