Orientation and Phase Relationships between Titania Films and Polycrystalline BaTiO3 Substrates as Determined by Electron Backscatter Diffraction Mapping

被引：28

作者：

Burbure, Nina V. ^{[1
]}

Salvador, Paul A. ^{[1
]}

Rohrer, Gregory S. ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 2010年 / 93卷 / 09期

基金：

美国国家科学基金会;

关键词：

TIO2; THIN-FILMS; PHOTOCHEMICAL REACTIVITY; CRYSTAL FACES; GROWTH; LAALO3; SRTIO3; RUTILE; PARTICLES;

D O I：

10.1111/j.1551-2916.2010.03878.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Titania films have been grown on polycrystalline BaTiO3 (BTO) substrates at 700 degrees C by pulsed laser deposition. Electron backscatter diffraction (EBSD) was used to determine grain orientations in the substrate before growth, and the phase and orientation of the supported films after growth. All BaTiO3 grains within 26 degrees of (001) were covered by anatase films with an orientation relationship of (001)(Anatase)parallel to(001)(BTO) and [100](Anatase)parallel to[100](BTO). Rutile with a variety of orientations grew on BaTiO3 grains with orientations closer to (110) and (111). EBSD mapping provides an efficient means for determining phase and orientation relationships of films over all orientation parameters.

引用

页码：2530 / 2533

页数：4

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