Concentration dependence of the dielectric constant in mixed oxides MxOyMp′Oq

被引:22
作者
Devine, RAB
Revesz, AG
机构
[1] Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
[2] USAF, Res Labs, Space Vehicles Directorate, Kirtland AFB, NM 87117 USA
[3] Revesz Associates, Bethesda, MD 20817 USA
关键词
D O I
10.1063/1.1375806
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dielectric constants in mixed oxides ZrO2+Y2O3, Ta2O5+TiO2, Ta2O5+Y2O3, and ZrO2+SiO2 are examined in the context of the oxide additivity rule for molecular polarizability. The experimentally observed concentration dependence of the dielectric constant can be satisfactorily explained by taking account of effective molecular polarizability and molecular volume changes. The simple rule thus enables predictive study of the dielectric constant of oxide alloys. (C) 2001 American Institute of Physics.
引用
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页码:389 / 393
页数:5
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