Multiple fault diagnosis in analogue circuits using time domain response features and multilayer perceptrons

被引：9

作者：

Ogg, S

Lesage, S

Jervis, BW

Maidon, Y

Zimmer, T

机构：

[1] Sheffield Hallam Univ, Sch Engn, Sheffield S1 1WB, S Yorkshire, England

[2] Univ Bordeaux 1, Microelect Lab, IXL, F-33405 Talence, France

来源：

IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS | 1998年 / 145卷 / 04期

关键词：

integrated circuits; artificial neural networks; multilayer perceptrons; fault diagnosis;

D O I：

10.1049/ip-cds:19982119

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A technique is described for diagnosing multiple faults in analogue circuits from their impulse response function using multilayer perceptrons, in terms of a specific example. A Dirac impulse input to the circuit was simulated, and time domain features of the output response were classified by a system of two multilayer perceptrons to produce accurate numerical fault values.

引用

收藏

页码：213 / 218

页数：6

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