SUPPLY CURRENT TESTING IN LINEAR BIPOLAR ICS

被引：17

作者：

PAPAKOSTAS, DK

HATZOPOULOS, AA

机构：

[1] Aristotle University of Thessaloniki, Department of Electrical Engineering, Division of Electronic and Computer Engineering

来源：

ELECTRONICS LETTERS | 1994年 / 30卷 / 02期

关键词：

LINEAR INTEGRATED CIRCUITS; BIPOLAR INTEGRATED CIRCUITS;

D O I：

10.1049/el:19940088

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for a representative (741 type) opamp. The circuit is simulated under both linear and nonlinear operation. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method.

引用

页码：128 / 130

页数：3

共 7 条

[1]

AMERASEKERA EA, 1987, FAILURE MECHANISMS S

[2] SUPPLY CURRENT TESTING OF MIXED ANALOG AND DIGITAL ICS [J].

BELL, IM ;

CAMPLIN, DA ;

TAYLOR, GE ;

BANNISTER, BR .

ELECTRONICS LETTERS, 1991, 27 (17) :1581-1583

[3] FAULT-DETECTION AND CLASSIFICATION IN LINEAR INTEGRATED-CIRCUITS - AN APPLICATION OF DISCRIMINATION ANALYSIS AND HYPOTHESIS-TESTING [J].

EPSTEIN, BR ;

CZIGLER, M ;

MILLER, SR .

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1993, 12 (01) :102-113

[4]

Hashizume M., 1991, Systems and Computers in Japan, V22, P18, DOI 10.1002/scj.4690221003

[5] QUIESCENT POWER-SUPPLY CURRENT MEASUREMENT FOR CMOS IC DEFECT DETECTION [J].

HAWKINS, CF ;

SODEN, JM ;

FRITZEMEIER, RR ;

HORNING, LK .

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 1989, 36 (02) :211-218

[6] ANALOG FAULT IDENTIFICATION BASED ON POWER-SUPPLY CURRENT SPECTRUM [J].

PAPAKOSTAS, DK ;

HATZOPOULOS, AA .

ELECTRONICS LETTERS, 1993, 29 (01) :118-119

[7] SELF-TESTING CMOS OPERATIONAL-AMPLIFIER [J].

ROCA, M ;

RUBIO, A .

ELECTRONICS LETTERS, 1992, 28 (15) :1452-1454

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