Study of orientation effect on nanoscale polarization in BaTiO3 thin films using piezoresponse force microscopy -: art. no. 192907

被引:53
作者
Kim, ID [1 ]
Avrahami, Y
Tuller, HL
Park, YB
Dicken, MJ
Atwater, HA
机构
[1] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
[2] CALTECH, Thomas J Watson Lab Appl Phys, Pasadena, CA 91125 USA
关键词
D O I
10.1063/1.1923173
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have investigated the effect of texture on in-plane (IPP) and out- of plane (OPP) polarizations of pulsed-laser-deposited BaTiO3 thin films grown on Pt and La0.5Sr0.5CoO3 (LSCO) buffered Pt electrodes. The OPP and IPP polarizations were observed by piezoresponse force microscopy (PFM) for three-dimensional polarization analyses in conjunction with conventional diffraction methods using x-ray diffraction and reflection high energy electron diffraction measurements. BaTiO3 films grown on Pt electrodes exhibited highly (101) preferred orientation with higher IPP component whereas BaTiO3 film grown on LSCO/Pt electrodes showed (001) and (101) orientations with higher OPP component. Measured effective d(33) values of BaTiO3 films deposited on Pt and LSCO/ Pt electrodes were 14.3 and 54.0 pm/ V, respectively. Local piezoelectric strain loops obtained by OPP and IPP-PFM showed that piezoelectric properties were strongly related to film orientation. (c) 2005 American Institute of Physics.
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页码:1 / 3
页数:3
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