Achromatic phase-shifting for two-wavelength phase-stepping interferometry

被引:20
作者
Hariharan, P
Roy, M
机构
关键词
D O I
10.1016/0030-4018(96)00118-6
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Achromatic phase-shifting can be used with two-wavelength illumination in a polarization interferometer to provide a quick and simple method for profiling surfaces exhibiting steps with heights of a few micrometres.
引用
收藏
页码:220 / 222
页数:3
相关论文
共 8 条
[1]   2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J].
CHENG, YY ;
WYANT, JC .
APPLIED OPTICS, 1984, 23 (24) :4539-4543
[2]   STEP HEIGHT MEASUREMENT USING 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY [J].
CREATH, K .
APPLIED OPTICS, 1987, 26 (14) :2810-2816
[3]  
Davidson M., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V775, P233, DOI 10.1117/12.940433
[4]   AN ACHROMATIC PHASE-SHIFTER OPERATING ON THE GEOMETRIC PHASE [J].
HARIHARAN, P ;
CIDDOR, PE .
OPTICS COMMUNICATIONS, 1994, 110 (1-2) :13-17
[5]   WHITE-LIGHT PHASE-STEPPING INTERFEROMETRY FOR SURFACE PROFILING [J].
HARIHARAN, P ;
ROY, M .
JOURNAL OF MODERN OPTICS, 1994, 41 (11) :2197-2201
[6]  
HARIHARAN P, 1985, OPTICAL INTERFEROMET, P119
[7]   MIRAU CORRELATION MICROSCOPE [J].
KINO, GS ;
CHIM, SSC .
APPLIED OPTICS, 1990, 29 (26) :3775-3783
[8]   PROFILOMETRY WITH A COHERENCE SCANNING MICROSCOPE [J].
LEE, BS ;
STRAND, TC .
APPLIED OPTICS, 1990, 29 (26) :3784-3788