共 36 条
[1]
ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY IN MATERIALS RESEARCH
[J].
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH,
1995, 150 (01)
:141-152
[2]
COMPUTATIONAL METHOD FOR DETERMINING N AND K FOR THIN FILM FROM MEASURED REFLECTANCE TRANSMITTANCE AND FILM THICKNESS
[J].
APPLIED OPTICS,
1966, 5 (01)
:41-&
[3]
BLISS DE, 1995, MATER RES SOC SYMP P, V358, P265
[6]
DESANCTIS O, 1995, MATER RES SOC SYMP P, V358, P253
[8]
RELATION BETWEEN LIGHT-SCATTERING AND THE MICROSTRUCTURE OF OPTICAL THIN-FILMS
[J].
APPLIED OPTICS,
1993, 32 (28)
:5475-5480
[9]
FELDMAN A, 1987, P SOC PHOTO-OPT INS, V821, P129
[10]
GACOIN T, 1995, MATER RES SOC SYMP P, V358, P247