Millimeter-wave scanning near-field microscope using a resonant waveguide probe

被引：26

作者：

Park, W ^{[1
]}

Kim, J ^{[1
]}

Lee, K ^{[1
]}

机构：

[1] Sogang Univ, Dept Phys, Seoul 121742, South Korea

来源：

APPLIED PHYSICS LETTERS | 2001年 / 79卷 / 16期

关键词：

D O I：

10.1063/1.1409944

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We demonstrate a millimeter-wave surface imaging technique using a near-field scanning millimeter-wave microscope with a resonant standard waveguide probe. The metallic probe tip in the resonant waveguide was designed to couple energy into and out of the resonant waveguide. By measuring the shift of the resonant frequency and the change of the quality factor in the near-field zone, we obtained millimeter-wave near-field images of YBa2Cu3Oy thin films on MgO substrates with a spatial resolution better than 2 mum. (C) 2001 American Institute of Physics.

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页码：2642 / 2644

页数：3

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