Ethylene adsorption on Ge(100)-(2x1): A combined angle-resolved photoemission and thermal desorption spectroscopy study

被引:25
作者
Fink, A [1 ]
Huber, R [1 ]
Widdra, W [1 ]
机构
[1] Tech Univ Munich, Phys Dept E20, D-85747 Garching, Germany
关键词
D O I
10.1063/1.1384552
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Ethylene adsorption on vicinal, single-domain Ge(100)-(2x1) has been investigated by thermal desorption spectroscopy (TPD) and angle-resolved photoemission (ARUPS) using linearly polarized synchrotron radiation. Thermal desorption experiments show that chemisorbed C2H4 desorbs from Ge(100) nondissociatively around 393 K with a high temperature shoulder which is tentatively assigned to step site desorption. The ethylene saturation coverage is strongly temperature dependent. Adsorption at 90 K saturates at 0.38 monolayer (ML), whereas adsorption at 170 K leads to a saturation coverage of approximately 1 ML. This behavior is explained by an adsorption barrier for coverages exceeding 0.38 ML. ARUP spectra for a dilute and the saturated ethylene monolayer reveal clear differences. Using photoemission selection rules a highly (C-2v) symmetric adsorption geometry with a C-C bond axis parallel to the Ge-Ge dimer axis is found for the dilute layer; whereas a reduced C-2 adsorption symmetry is found for the saturated ethylene layer. The comparison of photoemission spectra for C2H4 on Ge(100) and Si(100) shows that C2H4 is di-sigma bound to the dangling bonds of a single Ge-Ge dimer. For two molecular orbitals, 1b(3u) and 1b(2g), one-dimensional band structures with dispersion widths of 0.5 and 0.39 eV, respectively, along the Ge-Ge dimer rows are found which present a straightforward explanation for the observed symmetry reduction and adsorption behavior. (C) 2001 American Institute of Physics.
引用
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页码:2768 / 2775
页数:8
相关论文
共 26 条
[1]   The dimers stay intact: a quantitative photoelectron study of the adsorption system Si{100}(2x1)-C2H4 [J].
Baumgaertel, P. ;
Lindsay, R. ;
Schaff, O. ;
Giessel, T. ;
Terborg, R. ;
Hoeft, J. T. ;
Polcik, M. ;
Bradshaw, A. M. ;
Carbone, M. ;
Piancastelli, M. N. ;
Zanoni, R. ;
Toomes, R. L. ;
Woodruff, D. P. .
NEW JOURNAL OF PHYSICS, 1999, 1 :20.1-20.15
[2]   Density functional investigation of the geometric and electronic structure of ethylene adsorbed on Si(001) [J].
Birkenheuer, U ;
Gutdeutsch, U ;
Rösch, N ;
Fink, A ;
Gokhale, S ;
Menzel, D ;
Trischberger, P ;
Widdra, W .
JOURNAL OF CHEMICAL PHYSICS, 1998, 108 (23) :9868-9876
[3]   STUDIES OF SIC FORMATION ON SI (100) BY CHEMICAL VAPOR-DEPOSITION [J].
BOZSO, F ;
YATES, JT ;
CHOYKE, WJ ;
MUEHLHOFF, L .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) :2771-2778
[4]  
BRADSHAW AM, 1984, BESSY ANN REPORT, P59
[5]  
BROCKER D, 2000, THESIS TU MUNCHEN
[6]   ADSORPTION AND THERMAL-BEHAVIOR OF ETHYLENE ON SI(100)-(2X1) [J].
CLEMEN, L ;
WALLACE, RM ;
TAYLOR, PA ;
DRESSER, MJ ;
CHOYKE, WJ ;
WEINBERG, WH ;
YATES, JT .
SURFACE SCIENCE, 1992, 268 (1-3) :205-216
[7]   NOVEL CHARGED-PARTICLE ANALYZER FOR MOMENTUM DETERMINATION IN THE MULTI-CHANNELING MODE .1. DESIGN ASPECTS AND ELECTRON-ION OPTICAL-PROPERTIES [J].
ENGELHARDT, HA ;
BACK, W ;
MENZEL, D ;
LIEBL, H .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (06) :835-839
[8]   NOVEL CHARGED-PARTICLE ANALYZER FOR MOMENTUM DETERMINATION IN THE MULTICHANNELING MODE .2. PHYSICAL REALIZATION, PERFORMANCE TESTS, AND SAMPLE SPECTRA [J].
ENGELHARDT, HA ;
ZARTNER, A ;
MENZEL, D .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (08) :1161-1173
[9]   SIMPLE WAYS TO IMPROVE FLASH DESORPTION MEASUREMENTS FROM SINGLE-CRYSTAL SURFACES [J].
FEULNER, P ;
MENZEL, D .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (02) :662-663
[10]   Core-level spectroscopy of hydrocarbons adsorbed on Si(100)-(2X1): A systematic comparison [J].
Fink, A ;
Widdra, W ;
Wurth, W ;
Keller, C ;
Stichler, M ;
Achleitner, A ;
Comelli, G ;
Lizzit, S ;
Baraldi, A ;
Menzel, D .
PHYSICAL REVIEW B, 2001, 64 (04)