Polarization reversal anti-parallel to the applied electric field observed using a scanning nonlinear dielectric microscopy

被引:37
作者
Morita, T [1 ]
Cho, Y [1 ]
机构
[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan
关键词
Anti parallel poling - Lithium tantalite films - Scanning nonlinear dielectric microscopy;
D O I
10.1063/1.1637938
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ultrahigh-density storage devices consisting of poling reversed nanodots are examined using a scanning nonlinear dielectric microscope (SNDM). By using the SNDM, real-time observation of the poling direction was attempted and an unexpected phenomenon was discovered. For lithium tantalite films thicker than 350 nm, poling directions were aligned anti-parallel to the poling electric field. The critical thickness is thought to be dependent on the material properties, the probe radius, the applied voltage and the pulse duration. This anti-parallel poling phenomenon disagrees with previous poling reversal mechanisms from the conventional plate capacitor model. At present, the reason for and details of anti-parallel poling reversal are unclear, but may be related to the concentrated electric field near the cantilever. (C) 2004 American Institute of Physics.
引用
收藏
页码:257 / 259
页数:3
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