Optical and mechanical properties of alumina films fabricated on Kapton polymer by plasma immersion ion implantation and deposition using different biases

被引:19
作者
Huang, Yongxian
Tian, Xiubo [1 ]
Yang, Shiqin
Fu, Ricky K. Y.
Chu, Paul K.
机构
[1] Harbin Inst Technol, Sch Mat Sci & Engn, Harbin 150001, Peoples R China
[2] Shenzhen Tech Innovat Int, Shenzhen Key Lab Composite Mat, Shenzhen 518057, Peoples R China
[3] City Univ Hong Kong, Dept Phys & mat Sci, Kowloon, Hong Kong, Peoples R China
基金
中国国家自然科学基金;
关键词
plasma immersion ion implantation and deposition; alumina films; rutherford backscattering spectrometry; optical properties; crack resistance;
D O I
10.1016/j.apsusc.2007.06.011
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Alumina films are fabricated on Kapton polymer by aluminum plasma immersion ion implantation and deposition in an oxidizing ambient and the effects of the bias voltage on the film properties are investigated. Rutherford backscattering spectrometry (RBS) reveals successful deposition of alumina films on the polymer surface and that the O to Al ratio is higher than that of stoichiometric Al2O3. The thickness of the modified layers decreases from 200 to 120 nm when the bias voltage is increased from 5 to 20 W. Our results indicate that higher bombardment energy may lead to higher crack resistance and better film adhesion. However, a higher sample bias degrades the optical proper-ties of the films as indicated by the higher absorbance and lower energy band gap. Therefore, the processing voltage must be optimized to yield a protective layer with the appropriate thickness, superior optical properties, as well as high crack resistance. (C) 2007 Published by Elsevier B.V.
引用
收藏
页码:9483 / 9488
页数:6
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