Nanoscale analysis of interfaces in a metal/oxide/oxide trilayer obtained by pulsed laser deposition

被引：15

作者：

Fix, T.

Ulhaq-Bouillet, C.

Colis, S.

Dinia, A.

Bertoni, G.

Verbeeck, J.

Van Tendeloo, G.

机构：

[1] Univ Strasbourg, CNRS, Inst Phys & Chim Mat Strasbourg, ECPM,UMR 7504, F-67034 Strasbourg, France

[2] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium

来源：

APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 02期

关键词：

D O I：

10.1063/1.2755699

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Sr2FeMoO6/SrTiO3/CoFe2 trilayers grown by pulsed laser deposition on SrTiO3 (001) are investigated by transmission electron microscopy and electron energy loss spectroscopy. The stack is epitaxial, independent of whether the CoFe2 electrode is grown at 500 or at 50 degrees C. Thus it is possible to obtain epitaxy near room temperature. The SrTiO3/CoFe2 interface is quite sharp, while the Sr2FeMoO6/SrTiO3 interface presents regions of Fe depletion. The chemical composition of the films is close to the nominal stoichiometries. These results could be useful for the growth of heteroepitaxial devices and magnetic tunnel junctions. (C) 2007 American Institute of Physics.

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页数：3

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