Ti-catalyzed Si nanowires by chemical vapor deposition: Microscopy and growth mechanisms

被引:264
作者
Kamins, TI [1 ]
Williams, RS
Basile, DP
Hesjedal, T
Harris, JS
机构
[1] Hewlett Packard Labs, Quantum Sci Res, Palo Alto, CA 94304 USA
[2] Agilent Labs, Palo Alto, CA 94304 USA
[3] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA
关键词
D O I
10.1063/1.1335640
中图分类号
O59 [应用物理学];
学科分类号
摘要
Si nanowires grow rapidly by chemical vapor deposition on Ti-containing islands on Si surfaces when an abundant supply of Si-containing gaseous precursor is available. The density of wires is approximately the same as the density of the nucleating islands on the Si surface, although at least two different types of islands appear to correlate with very different wire growth rates. For the deposition conditions used, a minority of long, defect-free wires form, along with more numerous wires containing defects. Energy-dispersive x-ray spectroscopy shows that the Ti-containing nanoparticles remain at the tip of the growing wires. The estimated diffusion coefficient of Si in TiSi2 is consistent with the catalyzing nanoparticle remaining in the solid phase during nanowire growth. (C) 2001 American Institute of Physics.
引用
收藏
页码:1008 / 1016
页数:9
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