Fractal crystallization and nonlinear V-I behavior of Au/Ge bilayer film

被引:17
作者
Chen, ZW [1 ]
Zhang, SY
Tan, S
Hou, JG
Zhang, YH
Sekine, H
机构
[1] Univ Sci & Technol China, Struct Res Lab, Hefei 230026, Peoples R China
[2] Teikyo Univ, Sch Sci & Engn, Dept Elect & Elect Syst Engn, Utsunomiya, Tochigi 320, Japan
关键词
D O I
10.1063/1.1326851
中图分类号
O59 [应用物理学];
学科分类号
摘要
The fractal formation and V-I behavior of the Au/Ge bilayer film have been investigated with a transmission electron microscope and by the two-probe configuration method. The experimental results suggest that the Au/Ge bilayer film, after the fractal crystallization, shows a nonlinear V-I behavior. This phenomenon was explained by the random tunneling junction model. (C) 2001 American Institute of Physics.
引用
收藏
页码:783 / 785
页数:3
相关论文
共 25 条
[1]  
Bosnell J. R., 1970, Thin Solid Films, V6, P161, DOI 10.1016/0040-6090(70)90036-2
[2]   Fractal formation and tunnelling effects on the conductivity of Au/a-Ge bilayer films [J].
Chen, ZW ;
Zhang, SY ;
Tan, S ;
Tian, ML ;
Hou, JG ;
Zhang, YH .
THIN SOLID FILMS, 1998, 322 (1-2) :194-197
[3]  
Chen ZW, 1998, J VAC SCI TECHNOL A, V16, P2292, DOI 10.1116/1.581343
[4]   A RHEED STUDY OF EPITAXIAL-GROWTH OF IRON ON A SILICON SURFACE - EXPERIMENTAL-EVIDENCE FOR KINETIC ROUGHENING [J].
CHEVRIER, J ;
LETHANH, V ;
BUYS, R ;
DERRIEN, J .
EUROPHYSICS LETTERS, 1991, 16 (08) :737-742
[5]   PHASE-SEPARATION BY COUPLED SINGLE-CRYSTAL GROWTH AND POLYCRYSTALLINE FINGERING IN AL-GE - EXPERIMENT [J].
DEUTSCHER, G ;
LEREAH, Y .
PHYSICAL REVIEW LETTERS, 1988, 60 (15) :1510-1513
[6]  
Feder J., 1988, FRACTAL, P15
[7]  
HAUSER JJ, 1979, PHYS REV B, V7, P4099
[8]   EXPERIMENTAL DEMONSTRATION OF THE ROLE OF LOCAL LATENT-HEAT IN GE PATTERN-FORMATION [J].
HOU, JG ;
WU, ZQ .
PHYSICAL REVIEW B, 1990, 42 (06) :3271-3274
[9]   TEMPERATURE-DEPENDENCE OF FRACTAL FORMATION IN ION-IMPLANTED ALPHA-GE/AU BILAYER THIN-FILMS [J].
HOU, JG ;
WU, ZQ .
PHYSICAL REVIEW B, 1989, 40 (02) :1008-1012
[10]   SCANNING TUNNELING MICROSCOPY OBSERVATION OF SELF-AFFINE FRACTAL ROUGHNESS IN ION-BOMBARDED FILM SURFACES [J].
KRIM, J ;
HEYVAERT, I ;
VANHAESENDONCK, C ;
BRUYNSERAEDE, Y .
PHYSICAL REVIEW LETTERS, 1993, 70 (01) :57-60