Analytical threshold voltage model for short channel n(+)-p(+) double-gate SOI MOSFET's

被引:45
作者
Suzuki, K
Tosaka, Y
Sugii, T
机构
[1] Fujitsu Laboratories Ltd.
关键词
D O I
10.1109/16.491249
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Solving a two-dimensional (2-D) Poisson equation in the channel region, we have developed models for short channel n(+)-p(+) double-gate SOI MOSFET's, and showed how to design a device with a decreased gate length, suppressing short channel threshold voltage shift Delta V-th and subthreshold swing (S-swing) degradation. According to our model, we can design a 0.05-mu m L(G) device of which threshold voltage is 0.2 V, Delta V-th is 25 mV, and S-swing is 65 mV/decade with a 3-nm-thick gate oxide and 12-nm-thick SOI.
引用
收藏
页码:732 / 738
页数:7
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