Read write characteristics of hexagonal barium ferrite sputtered films prepared by post deposition annealing

Hexagonal barium ferrite (BaM) thin films were deposited onto crystallized glass, carbon, Si, SiO2/Si and quartz glass by a facing targets sputtering system and the read/write characteristics of BaM rigid disks were evaluated. The films were prepared at room temperature and crystallized in the air at 900 degrees C for 100 sec. The coercivities of BaM films were in a range of 1.0 to 3 kOe and Ms is around 220 emu/cm(3). The recording density, D-50, was in a range of 120 to 140 kfrpi by using MIG type head with the gap length of 0.2 mu m at 0.6 m/s, while D-50 was 180 kfpri by using an MR head at 1.0 m/s.