Mean energy required to produce an electron-hole pair in silicon for photons of energies between 50 and 1500 eV

被引:124
作者
Scholze, F [1 ]
Rabus, H [1 ]
Ulm, G [1 ]
机构
[1] Phys Tech Bundesanstalt, D-10587 Berlin, Germany
关键词
D O I
10.1063/1.368398
中图分类号
O59 [应用物理学];
学科分类号
摘要
The photon energy dependence of the mean energy W required to produce an electron-hole pair in silicon for photons with energies between 50 and 1500 eV was determined from the spectral responsivity of selected silicon photodiodes. The spectral responsivity was measured with a relative uncertainty of less than 0.3% using monochromatized synchrotron radiation whose radiant power was measured with a cryogenic electrical substitution radiometer. In order to deduce W from the spectral responsivity of photodiodes with a relative uncertainty of about l%, a method for the calculation of photon and electron escape losses from silicon photodiodes was developed and the model for the charge carrier recombination losses was improved. In contrast to recent theoretical and experimental results, a constant value W=(3.66+/-0.03) eV was obtained in the photon energy range from 50 to 1500 eV. The present experimental results are confirmed by calculation of the pair creation energy in silicon from data from the literature for the relevant material properties. The difference from previous theoretical work is due to different assumptions about the influence of the band structure of silicon. (C) 1998 American Institute of Physics. [S0021-8979(98)01817-9].
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页码:2926 / 2939
页数:14
相关论文
共 54 条
[1]   SCATTERING BY IONIZATION AND PHONON EMISSION IN SEMICONDUCTORS .2. MONTE-CARLO CALCULATIONS [J].
ALIG, RC .
PHYSICAL REVIEW B, 1983, 27 (02) :968-977
[2]   ELECTRON STORAGE RING BESSY AS A SOURCE OF CALCULABLE SPECTRAL PHOTON FLUX IN THE X-RAY REGION [J].
ARNOLD, D ;
ULM, G .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :1539-1542
[3]   QUANTUM YIELD OF ELECTRON-IMPACT IONIZATION IN SILICON [J].
CHANG, C ;
HU, CM ;
BRODERSEN, RW .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (02) :302-309
[4]   VACUUM EMISSION OF HOT-ELECTRONS FROM SILICON DIOXIDE AT LOW-TEMPERATURES [J].
DIMARIA, DJ ;
FISCHETTI, MV .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (09) :4683-4691
[5]   THE ENERGY NONLINEARITY OF A XENON GAS PROPORTIONAL SCINTILLATION-COUNTER AT THE K-ABSORPTION EDGE IN XENON [J].
DOSSANTOS, JMF ;
MORGADO, RE ;
TAVORA, LMN ;
CONDE, CAN .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 350 (1-2) :216-220
[6]   A PHYSICAL BASIS FOR THE EXTRAPOLATION OF SILICON PHOTODIODE QUANTUM EFFICIENCY INTO THE ULTRAVIOLET [J].
DURANT, NM ;
FOX, NP .
METROLOGIA, 1993, 30 (04) :345-350
[7]  
Edwards D.F., 1985, Handbook of optical constants of solids
[8]   ELECTRON SLOWING-DOWN SPECTRUM IN IRRADIATED SILICON [J].
EMERSON, LC ;
BIRKHOFF, RD ;
ANDERSON, VE ;
RITCHIE, RH .
PHYSICAL REVIEW B, 1973, 7 (05) :1798-1811
[9]   TRANSMISSION, ENERGY-DISTRIBUTION, AND SE EXCITATION OF FAST ELECTRONS IN THIN SOLID FILMS [J].
FITTING, HJ .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 26 (02) :525-535
[10]  
Fox NP, 1996, METROLOGIA, V32, P535, DOI 10.1088/0026-1394/32/6/28