QUANTUM YIELD OF ELECTRON-IMPACT IONIZATION IN SILICON

被引：137

作者：

CHANG, C

HU, CM

BRODERSEN, RW

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1985年 / 57卷 / 02期

关键词：

D O I：

10.1063/1.334804

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：302 / 309

页数：8

共 42 条

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