共 21 条
[2]
Dislocation strain field in ultrathin bonded silicon wafers studied by grazing incidence x-ray diffraction -: art. no. 165337
[J].
PHYSICAL REVIEW B,
2002, 65 (16)
:1653371-1653376
[3]
NATURAL SUPERSTEP FORMED ON GAAS VICINAL SURFACE BY METALORGANIC CHEMICAL VAPOR-DEPOSITION
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS,
1990, 29 (03)
:L483-L485
[5]
Simulation and observation of the step bunching process grown on GaAs(001) vicinal surface by metalorganic vapor phase epitaxy
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1996, 35 (2B)
:1280-1284
[6]
Bragg diffraction peaks in x-ray diffuse scattering from multilayers with rough interfaces
[J].
PHYSICAL REVIEW B,
1995, 52 (23)
:16369-16372
[7]
KASU M, 1992, JPN J APPL PHYS PT 2, V31, P864