Low-pressure magnetron sputtering

被引:101
作者
Musil, J
机构
[1] Univ W Bohemia, Dept Phys, Plzen 30614, Czech Republic
[2] Acad Sci Czech Republ, Inst Phys, CZ-18040 Prague 8, Czech Republic
关键词
D O I
10.1016/S0042-207X(98)00068-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The paper gives a short survey of the present state of art in low-pressure sputtering and self-sputtering. It shows main advantages of low pressure sputtering, particularly new physical conditions, i.e. (i) collisionless sight-of-line deposition process; (ii) assistance of fast neutrals in the film growth; and (iii) formation of films from ionised coating material and in the absence of an inert sputtering gas in the case of self-sputtering, under which novel materials with new physical properties can be formed. Principles of low-pressure sputtering are outlined. It is shown that there are two basic ways how to realise the low-pressure sputtering: (i) an improvement of plasma confinement in the sputtering discharge; and (ii) an additional ionisation of the working atmosphere. Also, sputtering systems used for low-pressure sputtering, including that recently developed, are discussed in detail. A special attention is devoted to the magnetron with a grooved target and the magnetron enhanced with rf and microwave magnetoactive plasma. (C) 1998 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:363 / 372
页数:10
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