Surface effects in displacive phase transformations studied by X-ray specular reflectivity

被引：11

作者：

Klemradt, U ^{[1
]}

Fromm, M ^{[1
]}

Landmesser, G ^{[1
]}

Amschler, H ^{[1
]}

Peisl, J ^{[1
]}

机构：

[1] Univ Munich, Sekt Phys, D-80539 Munich, Germany

来源：

PHYSICA B | 1998年 / 248卷

关键词：

displacive phase transitions; X-ray specular reflectivity;

D O I：

10.1016/S0921-4526(98)00208-7

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We report the first application of specular reflectivity to measure the formation of surface reliefs resulting from displacive phase transformations. It is demonstrated for the martensitic transformation of Ni62.5Al37.5 and the two step transformation of Ni2MnGa that relief heights ranging from the nanoscopic to the mesoscopic scale can be characterized by reflectivity experiments. Since a mesoscopic surface relief shows up as a dip below the critical angle, this opens up the opportunity to study displacive phase transitions at the intensity level of total external reflection. The application of the technique to surface nucleation problems is discussed. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：83 / 89

页数：7

共 17 条

[11] DETERMINATION OF THE DISPERSIVE CORRECTION F'(E) TO THE ATOMIC FORM-FACTOR FROM X-RAY REFLECTION [J].