X-RAY-DIFFRACTION FROM LATERALLY STRUCTURED SURFACES - TOTAL EXTERNAL REFLECTION AND GRATING TRUNCATION RODS

被引：44

作者：

TOLAN, M ^{[1
]}

KONIG, G ^{[1
]}

BRUGEMANN, L ^{[1
]}

PRESS, W ^{[1
]}

BRINKOP, F ^{[1
]}

KOTTHAUS, JP ^{[1
]}

机构：

[1] UNIV MUNICH,SEKT PHYS,W-8000 MUNICH 22,GERMANY

来源：

EUROPHYSICS LETTERS | 1992年 / 20卷 / 03期

关键词：

D O I：

10.1209/0295-5075/20/3/006

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A high-resolution study of X-ray scattering from a laterally structured surface is reported. Total external reflection displays a distinct dip in the reflectivity for incident angles theta < theta(c) (critical angle) and around a Bragg peak a system of truncation rods is found. Generalized Fresnel equations in conjunction with a kinematical theory provide a quantitative explanation of both findings. The method is well suited for characterising modulations on a mesoscopic length scale.

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页码：223 / 228

页数：6

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