Monte Carlo modeling of Si(100) roughening due to adsorbate-adsorbate repulsion

被引:9
作者
Aldao, CM
Guidoni, SE
Xu, GJ
Nakayama, KS
Weaver, JH
机构
[1] Univ Illinois, Dept Mat Sci & Engn, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA
[2] Univ Nacl Mar Plata, CONICET, INTEMA, Mar Del Plata, Argentina
基金
美国国家科学基金会;
关键词
Monte Carlo simulations; surface roughening; surface structure; morphology; roughness; and topography; silicon; halogens;
D O I
10.1016/j.susc.2004.01.005
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The pits and Si regrowth islands that form during the roughening of Si(100) by Cl at 700 K have characteristic patterns that depend on the amount of adsorbed Cl, suggesting the importance of adsorbate-adsorbate steric repulsive interactions. Monte Carlo simulations of roughening focused on those interactions. While the resulting morphology resembles those observed at intermediate coverage, the inability of the simulations to reproduce the experiment results at low coverage indicates that other interactions must be considered, including strain anisotropies that would favor the formation of large features. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:143 / 149
页数:7
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