Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy

被引：75

作者：

Oshima, Yoshifumi ^{[1
,2
]}

Sawada, Hidetaka ^{[1
,3
]}

Hosokawa, Fumio ^{[1
,3
]}

Okunishi, Eiji ^{[1
,3
]}

Kaneyama, Toshikatsu ^{[1
,3
]}

Kondo, Yukihito ^{[1
,3
]}

Niitaka, Seiji ^{[4
]}

Takagi, Hidenori ^{[4
]}

Tanishiro, Yasumasa ^{[1
,5
]}

Takayanagi, Kunio ^{[1
,5
]}

机构：

[1] CREST, Japan Sci & Technol Agcy, Chiyoda Ku, Tokyo 1020075, Japan

[2] Tokyo Inst Technol, Dept Mat Sci & Engn, Midori Ku, Yokohama, Kanagawa 2268502, Japan

[3] JEOL Ltd, Tokyo 1968558, Japan

[4] RIKEN, Magnet Mat Lab, Wako, Saitama 3510198, Japan

[5] Tokyo Inst Technol, Dept Condensed Matter Phys, Meguro Ku, Tokyo 1528551, Japan

来源：

JOURNAL OF ELECTRON MICROSCOPY | 2010年 / 59卷 / 06期

基金：

日本科学技术振兴机构;

关键词：

aberration correction; cold field emission gun; scanning transmission electron microscopy; lithium; spinel structure; annular bright field microscopy; ION BATTERIES; RESOLUTION; SPINEL;

D O I：

10.1093/jmicro/dfq017

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We visualized lithium atom columns in LiV2O4 crystals by combining scanning transmission electron microscopy with annular bright field (ABF) imaging using a spherical aberration-corrected electron microscope (R005) viewed from the [110] direction. The incident electron beam was coherent with a convergent angle of 30 mrad (semi-angle), and the detector collected scattered electrons over 20-30 mrad (semi-angle). The ABF image showed dark dots corresponding to lithium, vanadium and oxygen columns.

引用

页码：457 / 461

页数：5

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