Persistent photoconductivity in Si delta-doped GaAs at low doping concentration

被引:9
作者
Chen, CY
Thio, T
Wang, KL
Alt, KW
Sharma, PC
机构
[1] NEC Res Inst, Princeton, NJ 08540 USA
[2] Univ Calif Los Angeles, Dept Elect Engn, Los Angeles, CA 90095 USA
关键词
D O I
10.1063/1.122729
中图分类号
O59 [应用物理学];
学科分类号
摘要
In addition to the persistent photoconductivity (PPC) attributed to DX centers in GaAs delta-doped with Si, a weak PPC (WPPC) with a PPC carrier density independent of Si-doping concentration has been generally reported at ambient atmosphere, but the nature of the deep states responsible has not been elucidated. Here, we present the results of a detailed study of the WPPC in delta-GaAs: Si at low-doping densities, N-Si approximate to 1-3 x 10(12) cm(-2), and ambient pressure. It is concluded that the WPPC does not arise from DX centers but from another deep defect, which is DX-like in the sense that it can be metastably excited. The presence of two distinct DX-like states is apparent from two separate annealing temperatures of the PPC, T-a approximate to 50 K and T-b approximate to 230 K; to the best of our knowledge, the latter is the highest annealing temperature observed in the AlGaAs: Si system. (C) 1998 American Institute of Physics. [S0003-6951(98)00148-X].
引用
收藏
页码:3235 / 3237
页数:3
相关论文
共 14 条
[1]   Inverted charge states of anion and cation-site vacancies in zincblende semiconductors: Theory [J].
Chadi, DJ .
DEFECTS IN SEMICONDUCTORS - ICDS-19, PTS 1-3, 1997, 258-2 :1321-1328
[2]   THEORY OF THE ATOMIC AND ELECTRONIC-STRUCTURE OF DX CENTERS IN GAAS AND ALXGA1-XAS ALLOYS [J].
CHADI, DJ ;
CHANG, KJ .
PHYSICAL REVIEW LETTERS, 1988, 61 (07) :873-876
[3]   PERSISTENT PHOTOCONDUCTIVITY IN THIN UNDOPED GAINP/GAAS QUANTUM-WELLS [J].
ELHAMRI, S ;
AHOUJJA, M ;
RAVINDRAN, K ;
MAST, DB ;
NEWROCK, RS ;
MITCHEL, WC ;
BROWN, GJ ;
LO, I ;
RAZEGHI, M ;
HE, XG .
APPLIED PHYSICS LETTERS, 1995, 66 (02) :171-173
[4]   OBSERVATION OF HIGH MOBILITY AND CYCLOTRON-RESONANCE IN 20-A SILICON DELTA-DOPED GAAS GROWN BY MBE AT 480-DEGREES-C [J].
KOENRAAD, PM ;
BLOM, FAP ;
LANGERAK, CJGM ;
LEYS, MR ;
PERENBOOM, JAAJ ;
SINGLETON, J ;
SPERMON, SJRM ;
VANDERVLEUTEN, WC ;
VONCKEN, APJ ;
WOLTER, JH .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1990, 5 (08) :861-866
[5]   Effect of illumination on the subband electronic structure of Si delta-doped GaAs [J].
Li, G ;
Jagadish, C .
APPLIED PHYSICS LETTERS, 1997, 70 (01) :90-92
[6]   DEEP DONOR LEVELS (DX CENTERS) IN III-V SEMICONDUCTORS [J].
MOONEY, PM .
JOURNAL OF APPLIED PHYSICS, 1990, 67 (03) :R1-R26
[7]  
Schubert E F, 1996, DELTA DOPING SEMICON
[8]   SUBBAND DEPENDENT MOBILITIES AND CARRIER SATURATION MECHANISMS IN THIN SI DOPING LAYERS IN GAAS IN THE HIGH-DENSITY LIMIT [J].
SKURAS, E ;
KUMAR, R ;
WILLIAMS, RL ;
STRADLING, RA ;
DMOCHOWSKI, JE ;
JOHNSON, EA ;
MACKINNON, A ;
HARRIS, JJ ;
BEALL, RB ;
SKIERBESZEWSKI, C ;
SINGLETON, J ;
VANDERWEL, PJ ;
WISNIEWSKI, P .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1991, 6 (06) :535-546
[9]   WRITING ERASABLE METALLIC PATTERNS IN INSULATING ALXGA1-XASDX [J].
THIO, T ;
LINKE, RA ;
DEVLIN, GE ;
BENNETT, JW ;
CHADI, JD ;
MIZUTA, M .
APPLIED PHYSICS LETTERS, 1994, 65 (14) :1802-1804
[10]   Deep donors in Cd1-xZnxTe:Cl [J].
Thio, T ;
Bennett, JW .
PHYSICAL REVIEW B, 1996, 54 (03) :1754-1758