Visible blind GaN p-i-n photodiodes

被引:127
作者
Walker, D [2 ]
Saxler, A
Kung, P
Zhang, X
Hamilton, M
Diaz, J
Razeghi, M
机构
[1] USAF, Res Lab, Mat Directorate, Wright Patterson AFB, OH 45433 USA
[2] Northwestern Univ, Dept Elect & Comp Engn, Ctr Quantum Devices, Evanston, IL 60208 USA
关键词
D O I
10.1063/1.121631
中图分类号
O59 [应用物理学];
学科分类号
摘要
We present the growth and characterization of GaN p-i-n photodiodes with a very high degree of visible blindness. The thin films were grown by low-pressure metalorganic chemical vapor deposition. The room-temperature spectral response shows a high responsivity of 0.15 A/W up until 365 nm, above which the response decreases by six orders of magnitude. Current/voltage measurements supply us with a zero bias resistance of 10(11) Ohm. Lastly, the temporal response shows a rise and fall time of 2.5 mu s measured at zero bias. This response time is limited by the measurement circuit. (C) 1998 American Institute of Physics. [S0003-6951(98)01425-9].
引用
收藏
页码:3303 / 3305
页数:3
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