A sensitive method to measure changes in the surface stress of solids

被引:198
作者
Butt, HJ
机构
[1] Max-Planck-Inst. für Biophysik, 60596 Frankfurt
关键词
atomic force microscope; AFM; surface stress; surface energy of solids; biosensor;
D O I
10.1006/jcis.1996.0297
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A technique for determining surface stress changes at solid-gas and solid-liquid interfaces with an atomic force microscope is presented. Therefore, the bending of a microfabricated cantilever, prepared with different opposite faces, is measured. This bending is directly proportional to a change of Delta sigma(1) - Delta sigma(2), where sigma(1) and sigma(2) are the surface stresses of the two faces. To demonstrate the possibilities and limitations of the technique (i) a reduction of the surface stress of silicon nitride upon the covalent binding of gaseous dimethyldichlorosilane was measured; (ii) an increase of the surface stress of silicon nitride in aqueous medium with increasing pH was detected; (iii) the unspecific adsorption of the protein bovine albumin in buffer was monitored. The accuracy of the method is better than 0.005 J m(-2). The main limit is residual drift of the cantilever deflection. As a consequence only changes of the surface stress which occurred more rapidly than approximate to 0.02 J m(-2) h(-1) could be reliably detected. (C) 1996 Academic Press, Inc.
引用
收藏
页码:251 / 260
页数:10
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