A sensitive method to measure changes in the surface stress of solids

被引:198
作者
Butt, HJ
机构
[1] Max-Planck-Inst. für Biophysik, 60596 Frankfurt
关键词
atomic force microscope; AFM; surface stress; surface energy of solids; biosensor;
D O I
10.1006/jcis.1996.0297
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A technique for determining surface stress changes at solid-gas and solid-liquid interfaces with an atomic force microscope is presented. Therefore, the bending of a microfabricated cantilever, prepared with different opposite faces, is measured. This bending is directly proportional to a change of Delta sigma(1) - Delta sigma(2), where sigma(1) and sigma(2) are the surface stresses of the two faces. To demonstrate the possibilities and limitations of the technique (i) a reduction of the surface stress of silicon nitride upon the covalent binding of gaseous dimethyldichlorosilane was measured; (ii) an increase of the surface stress of silicon nitride in aqueous medium with increasing pH was detected; (iii) the unspecific adsorption of the protein bovine albumin in buffer was monitored. The accuracy of the method is better than 0.005 J m(-2). The main limit is residual drift of the cantilever deflection. As a consequence only changes of the surface stress which occurred more rapidly than approximate to 0.02 J m(-2) h(-1) could be reliably detected. (C) 1996 Academic Press, Inc.
引用
收藏
页码:251 / 260
页数:10
相关论文
共 83 条
[71]   THE SURFACE TENSION OF SOLIDS [J].
SHUTTLEWORTH, R .
PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION A, 1950, 63 (365) :444-457
[72]   POTENTIAL-DEPENDENT WETTING OF OCTADECANETHIOL-MODIFIED POLYCRYSTALLINE GOLD ELECTRODES [J].
SONDAGHUETHORST, JAM ;
FOKKINK, LGJ .
LANGMUIR, 1992, 8 (10) :2560-2566
[74]   THE MECHANICAL RESPONSE OF GOLD SUBSTRATES PASSIVATED BY SELF-ASSEMBLING MONOLAYER FILMS [J].
THOMAS, RC ;
HOUSTON, JE ;
MICHALSKE, TA ;
CROOKS, RM .
SCIENCE, 1993, 259 (5103) :1883-1885
[75]   THERMAL AND AMBIENT-INDUCED DEFLECTIONS OF SCANNING FORCE MICROSCOPE CANTILEVERS [J].
THUNDAT, T ;
WARMACK, RJ ;
CHEN, GY ;
ALLISON, DP .
APPLIED PHYSICS LETTERS, 1994, 64 (21) :2894-2896
[76]   ATOMIC RESOLUTION WITH AN ATOMIC FORCE MICROSCOPE USING PIEZORESISTIVE DETECTION [J].
TORTONESE, M ;
BARRETT, RC ;
QUATE, CF .
APPLIED PHYSICS LETTERS, 1993, 62 (08) :834-836
[77]   CHEMICAL ATTACHMENT OF CHLOROSILANES TO SILICA - A 2-STEP AMINE-PROMOTED REACTION [J].
TRIPP, CP ;
HAIR, ML .
JOURNAL OF PHYSICAL CHEMISTRY, 1993, 97 (21) :5693-5698
[78]  
Ulman A., 1991, ULTRATHIN ORGANIC FI
[79]  
VANVEEN JAR, 1985, J CHEM SOC CHEM COMM, V1043, P1656
[80]   APPLICABILITY OF THE CLASSICAL CURVATURE-STRESS RELATION FOR THIN-FILMS ON PLATE SUBSTRATES [J].
VONPREISSIG, FJ .
JOURNAL OF APPLIED PHYSICS, 1989, 66 (09) :4262-4268